Published February 15, 2009 | Version v1
Journal article

Growth and characterization of BLZT-CFO composite thin films

  • 1. Department of Physics, West Virginia University, Morgantown, WV 26506 (United States)
  • 2. Department of Inorganic Chemistry, University of Barcelona, C/Marti i Franques, 1-11, 08028, Barcelona (Spain)
  • 3. Department of Physics, Universidad del Valle, Building 320-3001, Cali (Colombia)
  • 4. Excellence Centre for Novel Materials, Universidad del Valle, A.A. 25360, Cali (Colombia)

Description

Composite Ba0.90La0.067Zr0.09Ti0.91O3-CoFe2O4 (BLZT-CFO) thin films were prepared by rf-magnetron sputtering from a 0.68 BLZT-0.32 CFO mixed target at a substrate temperature of 1033 K in a high oxygen pressure atmosphere. Single-crystal conducting Nb-doped (1%) SrTiO3 and Pt-coated Si substrates were used. X-ray diffraction (XRD) patterns revealed that the films had both BLZT and CFO phases. Scanning electron microscopy (SEM) showed that the CFO phase was intermixed into a BLZT matrix. X-ray photoelectron spectroscopy (XPS) data in depth profile mode showed that all constituent elements were present and confirmed the favourable TiO6-octahedron distortion in the BLZT-perovskite structure. The Au/BLZT-CFO/substrate capacitors were ferroelectric and magnetic at room temperature. The magnetoelectric nature of the composite thin films was demonstrated through the reduction of measured ferroelectric polarization with the application of an external magnetic field

Availability note (English)

Available from http://dx.doi.org/10.1016/j.matchemphys.2008.07.131

Additional details

Identifiers

DOI
10.1016/j.matchemphys.2008.07.131;
PII
S0254-0584(08)00579-8;

Publishing Information

Journal Title
Materials Chemistry and Physics
Journal Volume
113
Journal Issue
2-3
Journal Page Range
p. 702-706
ISSN
0254-0584
CODEN
MCHPDR

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.