Published October 2008 | Version v1
Journal article

Charge exchange spectroscopy as a fast ion diagnostic on TEXTOR

  • 1. FOM-Rijnhuizen, EURATOM-FOM, NL-3430 BE Nieuwegein (Netherlands)
  • 2. Association EURATOM-Risoe National Laboratory for Sustainable Energy, Technical University of Denmark, DK-4000 Roskilde (Denmark)
  • 3. Forschungszentrum Juelich, EURATOM-FZJ, D-52424 Juelich (Germany)

Description

An upgraded charge exchange spectroscopy diagnostic has been taken into operation at the TEXTOR tokamak. The angles of the viewing lines with the toroidal magnetic field are close to the pitch angles at birth of fast ions injected by one of the neutral beam injectors. Using another neutral beam for active spectroscopy, injected counter the direction in which fast ions injected by the first beam are circulating, we can simultaneously measure a fast ion tail on the blue wing of the Dα spectrum while the beam emission spectrum is Doppler shifted to the red wing. An analysis combining the two parts of the spectrum offers possibilities to improve the accuracy of the absolute (fast) ion density profiles. Fast beam modulation or passive viewing lines cannot be used for background subtraction on this diagnostic setup and therefore the background has to be modeled and fitted to the data together with a spectral model for the slowing down feature. The analysis of the fast ion Dα spectrum obtained with the new diagnostic is discussed.

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
79
Journal Issue
10
Journal Page Range
p. 10E522-10E522.4
ISSN
0034-6748
CODEN
RSINAK

Conference

Title
17. topical conference on high-temperature plasma diagnostics
Acronym
HTPD08
Dates
11-15 May 2008
Place
Albuquerque, NM (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41016001
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; BEAMS; CHARGE EXCHANGE; DOPPLER EFFECT; EMISSION SPECTRA; ION DENSITY; IONS; MAGNETIC FIELDS; PLASMA DIAGNOSTICS; SLOWING-DOWN; SPECTROSCOPY; TEXTOR TOKAMAK; THERMONUCLEAR REACTORS
Descriptors DEC
CHARGED PARTICLES; CLOSED PLASMA DEVICES; SPECTRA; THERMONUCLEAR DEVICES; TOKAMAK DEVICES

Optional Information

Notes
(c) 2008 American Institute of Physics