Published January 15, 2014 | Version v1
Journal article

Radiation stability of SiO2 micro- and nanopowders under electron and proton exposure

  • 1. Science and Technology on Material Performance Evaluating in Space Environment Laboratory, Harbin Institute of Technology, Harbin, Heilongjiang Province 150001 (China)
  • 2. Radiation and Space Materials Laboratory, Tomsk State University of Control Systems and Radio-electronics, Tomsk, Tomsk Region 634050 (Russian Federation)
  • 3. Space Materials Laboratory, Amur State University, Blagoveshchensk, Amur Region 675027 (Russian Federation)

Description

The effects of proton and electron (E = 100 keV, F = 5 × 1015 cm−2) exposure on the reflective spectra of SiO2 micro- and nanopowders in wavelength range from 250 to 2500 nm have been investigated. It has been established that the reflectance and radiation stability of nanopowders is less than that of micropowders. This effect is caused by the high concentration of radiation defects, which act as surface absorption centers (Es′ centers) near the energies 5.47 and 4.45 eV, and peroxide silicon defects (≡Si-O-O-Si≡) near the energy 3.84 eV

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2013.11.007

Additional details

Identifiers

DOI
10.1016/j.nimb.2013.11.007;
PII
S0168-583X(13)01145-2;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
319
Journal Page Range
p. 123-127
ISSN
0168-583X
CODEN
NIMBEU

INIS

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.