MWCNT induced negative real permittivity in a copolyester of Bisphenol-A with terephthalic and isophthalic acids
Creators
- 1. Yildiz Technical University, Physics Department, 34220, Esenler, Istanbul (Turkey)
- 2. Yildiz Technical University, Chemistry Department, 34220, Esenler, Istanbul (Turkey)
- 3. Leibniz Institute of Polymer Research Dresden (IPF), Hohe Straße 6, 01069 Dresden (Germany)
Description
In the present study, the negative real permittivity behavior of a copolyester of bisphenol-A with terephthalic acid and isophthalic acid (PAr) containing 1.5 to 7.5 wt% multi-walled carbon nanotubes (MWCNTs) have been investigated in detail. The structural and morphological analysis of the melt-mixed composites was performed by Fourier transform infrared spectroscopy using attenuated total reflection (FTIR-ATR), atomic force microscopy (AFM), x-ray diffraction (XRD), and light microscopy. The influences of the MWCNT filler on the AC impedance, complex permittivity, and AC conductivity of the PAr polymer matrix were investigated at different operating temperatures varied between 296 K and 373 K. The transition from a negative to positive real permittivity was observed at different crossover frequencies depending on the MWCNT content of the composites whereas pure PAr showed positive values at all frequencies. The negative real permittivity characteristic of the composites was discussed in the context of Drude model. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2053-1591/ab6887Additional details
Identifiers
Publishing Information
- Journal Title
- Materials Research Express (Online)
- Journal Volume
- 7
- Journal Issue
- 1
- Journal Page Range
- [16 p.]
- ISSN
- 2053-1591
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52101158
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; FOURIER TRANSFORM SPECTROMETERS; INFRARED SPECTRA; PERMITTIVITY; POLYMERS; REFLECTION; TEREPHTHALIC ACID; X-RAY DIFFRACTION
- Descriptors DEC
- CARBON; CARBOXYLIC ACIDS; COHERENT SCATTERING; DICARBOXYLIC ACIDS; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRICAL PROPERTIES; ELEMENTS; MEASURING INSTRUMENTS; MICROSCOPY; NANOSTRUCTURES; NANOTUBES; NONMETALS; ORGANIC ACIDS; ORGANIC COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SPECTRA; SPECTROMETERS