Direct observation of strain in bulk subgrains and dislocation walls by high angular resolution three-dimensional X-ray diffraction
- 1. Center for Fundamental Research: Metal Structures in Four Dimensions, Materials Research Department, Riso National Laboratory, Frederiksborgvej 399, 4000 Roskilde (Denmark)
- 2. Argonne National Laboratory, Advanced Photon Source, 9700 South Cass Avenue, Argonne, IL 60439 (United States)
Description
The X-ray diffraction (XRD) method 'high angular resolution 3DXRD' is briefly introduced, and results are presented for a single bulk grain in a polycrystalline copper sample deformed in tension. It is found that the three-dimensional reciprocal-space intensity distribution of a 400 reflection associated with the grain, shows a distinct structure consisting of sharp bright peaks superimposed on a cloud of enhanced intensity. The bright peaks (which arise from individual subgrains) are found to be subjected to backward strain (on average) while the fraction of the material giving rise to the cloud of enhanced intensity is subjected to forward strain. Based on the latter observation the, originally tentative, interpretation of the cloud as arising from dislocation walls is substantiated
Availability note (English)
Available from http://dx.doi.org/10.1016/j.msea.2006.12.168Additional details
Identifiers
- DOI
- 10.1016/j.msea.2006.12.168;
- PII
- S0921-5093(07)00847-7;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 483-484
- Journal Page Range
- p. 641-643
- ISSN
- 0921-5093
- CODEN
- MSAPE3
Conference
- Title
- 14. international conference on the strength of materials
- Dates
- 4-9 Jun 2006
- Place
- Xian (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40025521
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COPPER; DISLOCATIONS; PLASTICITY; POLYCRYSTALS; STRAINS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELEMENTS; LINE DEFECTS; MECHANICAL PROPERTIES; METALS; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.