Direct determination of a radiation-damage profile with atomic resolution in ion-irradiated platinum. MSC report No. 5030
Description
The field-ion microscope (FIM) technique has been employed to determine directly a radiation damage profile, with atomic resolution, in a platinum specimen which had been irradiated at 800K with 20-keV Kr+ ions to a fluence of 5 x 1012 cm-2. It is shown that the microscopic spatial-vacancy distribution (radiation-damage profile) is directly related to the elastically-deposited-energy profile. The experimentally constructed radiation-damage profile is compared with a theoretical damage profile - calculated employing the TRIM Monte Carlo code - and excellent agreement is obtained between the two, thus demonstrating that it is possible to go directly from a microscopic spatial distribution of vacancies to a continuous radiation-damage profile
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE83014982.
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Additional details
Publishing Information
- Imprint Pagination
- 12 p.
- Report number
- DOE/ER/03518--107
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 14795217
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ION BEAMS; ION MICROSCOPY; KEV RANGE 10-100; KRYPTON IONS; LOW TEMPERATURE; PHYSICAL RADIATION EFFECTS; PLATINUM; VACANCIES
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; ENERGY RANGE; IONS; KEV RANGE; METALS; MICROSCOPY; PLATINUM METALS; POINT DEFECTS; RADIATION EFFECTS; TRANSITION ELEMENTS