Effect of Argon Gas Flow Rate on the Optical and Mechanical Properties of Sputtered Tungsten Thin Film Coatings
- 1. Department of Mechanical Engineering, R.V. College of Engineering (India)
- 2. Department of Aerospace Engineering, R.V. College of Engineering (India)
Description
Tungsten thin film coatings were deposited on SS304 substrates by DC magnetron sputtering process. Optical and mechanical properties changes have been studied as a function of varying argon gas flow rate during magnetron sputtering process. The effect of argon flow rate on depositionrate, mechanical and optical properties of the tungsten films prepared at Different power rate was investigated by surface profilometer, nanoindenter, FESEM and UV Vis NIR spectrometer. With increasing argon gas flow rate increases deposition rate and hence higher IR reflectance in IR region and at lower argon gas flow rate the absorptance is higher. The optimized results allows us to select the deposition condition for solar absorptance and thermal emittance for solar thermal applications. The XRD analysis shows that the deposited tungsten thin film coatings were in polycrystalline in nature and surface roughness increases with increase in argon gas flow rate. Nanoindentation test result yields that hardness of DC magnetronsputtered tungsten thin film increases with argon gas flow rate from 200sccm to 500sccm. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/149/1/012075Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 149
- Journal Issue
- 1
- Journal Page Range
- [8 p.]
- ISSN
- 1757-899X
Conference
- Title
- International conference on advances in materials and manufacturing applications
- Acronym
- IConAMMA-2016
- Dates
- 14-16 Jul 2016
- Place
- Bangalore (India)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49074216
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON; COATINGS; DEPOSITION; FLOW RATE; GAS FLOW; HARDNESS; MAGNETRONS; MECHANICAL PROPERTIES; OPTICAL PROPERTIES; POLYCRYSTALS; ROUGHNESS; SPECTROMETERS; SPUTTERING; SUBSTRATES; SURFACES; THIN FILMS; TUNGSTEN; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; FLUID FLOW; FLUIDS; GASES; MEASURING INSTRUMENTS; MECHANICAL PROPERTIES; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NONMETALS; PHYSICAL PROPERTIES; RARE GASES; REFRACTORY METALS; SCATTERING; SURFACE PROPERTIES; TRANSITION ELEMENTS