Published September 1975 | Version v1
Journal article Metadata-only

Measuring coating thickness by the beta-backscatter technique

Creators

  • 1. Fischer Instrumentation (GB) Ltd., Newbury (UK)

Description

The capabilities of the β-ray backscatter technique for measuring coatings of various materials on different substrates is described. Practical instrumentation is explained including continuous and contactless measurement systems. (author)

Additional details

Publishing Information

Journal Title
Br. J. Non-Destr. Test.
Journal Volume
17
Journal Issue
5
Series
Br. J. Non-Destr. Test.
Journal Page Range
145-152

Conference

Title
Measuring the thickness of coatings on metals non-destructively.
Dates
30 Apr 1975.
Place
Derby, UK.

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
7225334
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BACKSCATTERING; BETA DETECTION; COATINGS; COST BENEFIT ANALYSIS; ELECTRONIC EQUIPMENT; RADIOMETRIC GAGES; THICKNESS GAGES
Descriptors DEC
CHARGED PARTICLE DETECTION; MEASURING INSTRUMENTS; RADIATION DETECTION; SCATTERING