Published February 25, 2009 | Version v1
Journal article

Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy

  • 1. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)

Description

An approach for the analysis of multi-dimensional, spectroscopic-imaging data based on principal component analysis (PCA) is explored. PCA selects and ranks relevant response components based on variance within the data. It is shown that for examples with small relative variations between spectra, the first few PCA components closely coincide with results obtained using model fitting, and this is achieved at rates approximately four orders of magnitude faster. For cases with strong response variations, PCA allows an effective approach to rapidly process, de-noise, and compress data. The prospects for PCA combined with correlation function analysis of component maps as a universal tool for data analysis and representation in microscopy are discussed.

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/20/8/085714

Additional details

Identifiers

DOI
10.1088/0957-4484/20/8/085714;
PII
S0957-4484(09)94134-4;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
20
Journal Issue
8
Journal Page Range
[7 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41017521
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; CORRELATION FUNCTIONS; DATA ANALYSIS; NANOSTRUCTURES; PROBES; SPECTRA
Descriptors DEC
FUNCTIONS; MICROSCOPY