Published April 1, 2020 | Version v1
Journal article

Adaptive and efficient Fourier ptychographic microscopy based on information entropy

  • 1. Advanced Microscopy and Instrumentation Research Center, School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin 150080 (China)
  • 2. Space Environment Simulation Research Infrastructure, Harbin Institute of Technology, Harbin 150080 (China)

Description

Fourier ptychographic microscopy is a simple and effective computational imaging method that improves the spatial bandwidth product of the system. Its principle is to realize the aperture expansion by using a phase retrieval algorithm to splice a set of low-resolution images under different illumination angles in the Fourier domain. However, the long periods of time required for the data acquisition limit its application. Therefore, we propose a new adaptive FP algorithm to significantly reduce the volume of data acquired using the information entropy of the image as a judgment function, and a special separation strategy as a judgment method to estimate the information distribution of a high-resolution sample from a specific low-resolution image. Further, the effectiveness and superiority of our method are verified via simulations and experiments. The results show that the volume of data acquired can be reduced by more than 60% without any deterioration in resolution and quality of the recovered image. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/2040-8986/ab78a8

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Optics (Online)
Journal Volume
22
Journal Issue
4
Journal Page Range
[7 p.]
ISSN
2040-8986

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
53015829
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ALGORITHMS; DATA ACQUISITION; DISTRIBUTION; ENTROPY; FUNCTIONS; MICROSCOPY; RESOLUTION; SIMULATION
Descriptors DEC
DATA PROCESSING; MATHEMATICAL LOGIC; PHYSICAL PROPERTIES; PROCESSING; THERMODYNAMIC PROPERTIES