Published July 1995 | Version v1
Book

Sep-up of total reflection X-ray fluorescence analysis technique

  • 1. Yantai Univ. (China). Dept. of Physics
  • 2. Academia Sinica, Lanzhou (China). Inst. of Modern Physics

Description

no abstract available

Additional details

Publishing Information

Publisher
Atomic Energy Press
Imprint Place
Beijing (China)
ISBN
7-5022-1398-8
Imprint Title
1994 annual report IMP and NLHIAL
Imprint Pagination
214 p.
Journal Page Range
p. 165-166

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
30018128
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
COPPER; REFLECTION; USES; X-RAY FLUORESCENCE ANALYSIS; X-RAY TUBES
Descriptors DEC
CHEMICAL ANALYSIS; ELECTRON TUBES; ELEMENTS; EQUIPMENT; METALS; NONDESTRUCTIVE ANALYSIS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS; X-RAY EQUIPMENT