Published July 1995
| Version v1
Book
Sep-up of total reflection X-ray fluorescence analysis technique
- 1. Yantai Univ. (China). Dept. of Physics
- 2. Academia Sinica, Lanzhou (China). Inst. of Modern Physics
Description
no abstract available
Additional details
Publishing Information
- Publisher
- Atomic Energy Press
- Imprint Place
- Beijing (China)
- ISBN
- 7-5022-1398-8
- Imprint Title
- 1994 annual report IMP and NLHIAL
- Imprint Pagination
- 214 p.
- Journal Page Range
- p. 165-166
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 30018128
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- COPPER; REFLECTION; USES; X-RAY FLUORESCENCE ANALYSIS; X-RAY TUBES
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTRON TUBES; ELEMENTS; EQUIPMENT; METALS; NONDESTRUCTIVE ANALYSIS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS; X-RAY EQUIPMENT