Published 2002
| Version v1
Journal article
D17: the new reflectometer at the ILL
Creators
- 1. Institut Laue Langevin (ILL), 6 Jules Horowitz, 38042 Grenoble (France)
Description
The reflectometer D17 has been operational for a year and has already proved to be an excellent tool for investigating surfaces and interfaces in the realms of physics, biology and chemistry. The instrument has two modes of operation, time-of-flight and monochromatic, the latter incorporating the polarised-neutron option. Both modes are flexible in the wave-vector-transfer (q) resolution. The loosest resolution required to resolve the sample structure can be chosen (and hence the highest flux), enabling the lowest reflectivities and hence the widest q-range to be measured. (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1007/s003390201611Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing
- Journal Volume
- 74
- Journal Issue
- 1,Suppl
- Journal Page Range
- p. s329-s331
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 34024386
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BRAGG REFLECTION; INTERFACES; NEUTRON DIFFRACTOMETERS; NEUTRON FLUX; POLARIZED BEAMS; REFLECTIVITY; RESOLUTION; SURFACES; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- BEAMS; DIFFRACTOMETERS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION FLUX; REFLECTION; SURFACE PROPERTIES
Optional Information
- Notes
- With 3 figs., 6 refs.