Published December 1989
| Version v1
Journal article
Evaluation of surface roughness parameters of metal films by light scattering technique
Description
Light scattering is a powerful method to evaluate surface roughness parameters. From the information on radiation produced by the surface roughness we are able to get a pair of roughness parameter, i.e. the amplitude of surface corrugation and the transverse correlation length. However, the parameters evaluated by such a way cannot explain the whole angular distribution of scattered light intensity. We show that the angular distribution of scattered light intensity can be properly explained by a combination of several parameters. (author)
Additional details
Publishing Information
- Journal Title
- Journal of the Physical Society of Japan
- Journal Volume
- 58
- Journal Issue
- 12
- Series
- J. Phys. Soc. Jpn.
- Journal Page Range
- 4511-4516
- ISSN
- 0031-9015
- CODEN
- JUPSA
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 21033158
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM; ANGULAR DISTRIBUTION; DEPTH; FILMS; GOLD; METALS; ROUGHNESS; SCATTERING; SILVER; SURFACES; VISIBLE RADIATION
- Descriptors DEC
- DIMENSIONS; DISTRIBUTION; ELECTROMAGNETIC RADIATION; ELEMENTS; RADIATIONS; SURFACE PROPERTIES; TRANSITION ELEMENTS