Published January 2005
| Version v1
Journal article
Design and simulation of resistive SOI CMOS micro-heaters for high temperature gas sensors
- 1. Research Laboratories, DENSO Corporation, 500-1 Minamiyama, Komenoki, Nisshin, Aichi (Japan)
- 2. School of Engineering, University of Warwick, Coventry CV4 7AL (United Kingdom)
- 3. Department of Engineering, Cambridge University, Cambridge CB2 1PZ (United Kingdom)
Description
This paper describes the design of doped single crystal silicon (SCS) microhotplates for gas sensors. Resistive heaters are formed by an n+/p+ implantation into a Silicon-On-Insulator (SOI) wafer with a post-CMOS deep reactive ion etch to remove the silicon substrate. Hence they are fully compatible with CMOS technologies and allows for the integration of associated drive/detection circuitry. 2D electro-thermal models have been constructed and the results of numerical simulations using FEMLAB[reg] are given. Simulations show these micro-hotplates can operate at temperatures of 500 deg. C with a drive voltage of only 5 V and a power consumption of less than 100 mW
Availability note (English)
Available online at http://stacks.iop.org/1742-6596/15/27/jpconf5_15_005.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 15
- Journal Issue
- 1
- Journal Page Range
- p. 27-32
- ISSN
- 1742-6596
Conference
- Title
- 13. conference on sensors and their applications
- Dates
- 6-8 Sep 2005
- Place
- Medway (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37000506
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DESIGN; DOPED MATERIALS; ELECTRIC POTENTIAL; HEATERS; MONOCRYSTALS; SILICON; SIMULATION; SUBSTRATES; TEMPERATURE RANGE 0400-1000 K
- Descriptors DEC
- CRYSTALS; ELEMENTS; MATERIALS; SEMIMETALS; TEMPERATURE RANGE