3D silicon pixel detectors for the High-Luminosity LHC
Creators
- 1. Institut de Física d'Altes Energies (IFAE), The Barcelona Institute of Science and Technology (BIST), 08193 Bellaterra, Barcelona (Spain)
- 2. Centro Nacional de Microelectronica (CNM-IMB-CSIC), Campus UAB, 08193 Bellaterra, Barcelona (Spain)
Description
3D silicon pixel detectors have been investigated as radiation-hard candidates for the innermost layers of the HL-LHC upgrade of the ATLAS pixel detector. 3D detectors are already in use today in the ATLAS IBL and AFP experiments. These are based on 50 × 250 μm2 large pixels connected to the FE-I4 readout chip. Detectors of this generation were irradiated to HL-LHC fluences and demonstrated excellent radiation hardness with operational voltages as low as 180 V and power dissipation of 12–15 mW/cm2 at a fluence of about 1016 n eq/cm2, measured at -25°C. Moreover, to cope with the higher occupancies expected at the HL-LHC, a first run of a new generation of 3D detectors designed for the HL-LHC was produced at CNM with small pixel sizes of 50 × 50 and 25 × 100 μm2, matched to the FE-I4 chip. They demonstrated a good performance in the laboratory and in beam tests with hit efficiencies of about 97% at already 1–2 V before irradiation.
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/11/11/C11024Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 11
- Journal Issue
- 11
- Journal Page Range
- p. C11024
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49010334
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CERN LHC; EFFICIENCY; ELECTRIC POTENTIAL; IRRADIATION; LAYERS; LUMINOSITY; PERFORMANCE; RADIATION HARDNESS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; SILICON; THREE-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- ACCELERATORS; CYCLIC ACCELERATORS; ELEMENTS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; STORAGE RINGS; SYNCHROTRONS