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Published July 2020 | Version v1
Journal article

Phase stabilities and interfacial reactions of the Cu–In binary systems

  • 1. National Taiwan University. Department of Materials Science and Engineering, Taiwan (China)
  • 2. Tamkang University. Department of Chemical and Materials Engineering, Taiwan (China)

Description

The Cu–In binary system is receiving increasing attention due to its application in the low-temperature assembly of heat-sensitive devices. Nevertheless, the fundamental behaviors of this binary system are very difficult to study because of the extreme softness of indium. This difficulty was successfully overcome in this study, and the phase stabilities and chemical reactions were established. Binary Cu–In diffusion couples were prepared by electroplating In onto a Cu substrate. During the plating process, CuIn2 formed even though this intermetallic is not present in the Cu–In binary phase diagram. It was established in this study that CuIn2 is indeed a stable phase below 100 °C, but decomposes at a temperature between 100 and 120 °C. In addition, the microstructure evolution during solid-state aging at 100, 120, and 140 °C was investigated. The hardness values and Young's moduli for CuIn2 and Cu11In9 were measured by using nanoindentation.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Materials Science. Materials in Electronics
Journal Volume
31
Journal Issue
13
Journal Page Range
p. 10161-10169
ISSN
0957-4522
CODEN
JSMEEV

INIS

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Copyright (c) 2020 © Springer Science+Business Media, LLC, part of Springer Nature 2020