Front end electronics for silicon tungsten calorimeter
Creators
- 1. Laboratoire de Physique Corpusculaire de Clermont-Ferrand, IN2P3/CNRS, F-63177 Aubiere Cedex (France)
- 2. Laboratoire de l'Accelerateur Lineaire, IN2P3-CNRS et Universite de Paris-Sud, F-91898 Orsay (France)
Description
This document given at the conference as a power-point presentation has the following structure: 1. Requirements; 2. A design; 3. Adaptive stage; 4. Shaper; 5. Coding; 6. First ideas for ADC. The requirements are follows: - Maximum energy, up to 1 TeV. => bunch crossing 150 ns; - Time signal, between 20 ns-60 ns; - Train = 3000 bunch crossing; - One Train every 200 ms; - Dynamic = signal/noise = 14-15 bits; - Accuracy, 0.4 % i.e. 8 bits; - 30 Millions channels with 4 mW/channel max; - 128 channels/chip i.e. 240.000 chips. Particularly addressed are some ideas relating to accuracy vs. dynamics to get multi gain with choice of gain, namely: No preamplifier with multi-gain; Shaper multi-gain, Vout = energy; Energy value, only one measurement. In conclusion for the technology implied the choice was Cmos and SiGe, but for the moment, AMS 0.8 μm BiCMOS was used. Good results were obtained in testing the amplifier, improvement is required in the linearity of common to differential mode, while for ADC the consumption was either bipolar or Cmos. Also, conclusion concerning the multiplexer and analog memory is given
Availability note (English)
Available from internet atAdditional details
Identifiers
Publishing Information
- Imprint Pagination
- 18 p.
- Report number
- PCCF-RI--02-03
Conference
- Title
- second workshop of the extended ECFA/DESY study
- Acronym
- Physics and detectors for a 90 to 800 GeV linear collider
- Dates
- 12-15 Apr 2002
- Place
- Saint Malo (France)
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 34061024
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- CHARGED PARTICLE DETECTION; ELECTRONIC CIRCUITS; GAIN; GE SEMICONDUCTOR DETECTORS; GEV RANGE 10-100; GEV RANGE 100-1000; PULSE SHAPERS; SI SEMICONDUCTOR DETECTORS; SIGNAL-TO-NOISE RATIO; SILICON; TUNGSTEN
- Descriptors DEC
- AMPLIFICATION; DETECTION; ELECTRONIC CIRCUITS; ELEMENTS; ENERGY RANGE; GEV RANGE; MEASURING INSTRUMENTS; METALS; PULSE CIRCUITS; RADIATION DETECTION; RADIATION DETECTORS; REFRACTORY METALS; SEMICONDUCTOR DETECTORS; SEMIMETALS; SIGNAL CONDITIONERS; TRANSITION ELEMENTS
Optional Information
- Notes
- 11 figs.
- Collaborations
- CALICE Collaboration