Published March 1997
| Version v1
Journal article
Influence of electron irradiation on electrophysical properties of n-Pb1-xSnxTe (x≅2)
Creators
- 1. Moskovskij Gosudarstvennyj Univ. im. M.V. Lomonosova, (Russian Federation)
Description
The influence of electron irradiation (Tirr ≅ 300 K, E=6 MeV, Φ ≤ 8.4x1017 cm-2), on the galvanomagnetic properties of n-Pb1-xSnxTe has been investigated. It has been shown, that electron irradiation induces a reduction in the electron concentration and n-p-conversion. Differential rate of generation of donor-type and acceptor-type irradiation-induced defects is determined. An anomalous behaviour of galvanomagnetic parameters dependences versus temperature or magnetic fields of irradiated samples, connected with the appearance of p-type surface inversion layer under irradiation, has been revealed
Additional details
Additional titles
- Original title (Russian)
- Влияние облучения электронами на электрофизические свойства сплавов н-Пб
Publishing Information
- Journal Title
- Fizika i Tekhnika Poluprovodnikov
- Journal Volume
- 31
- Journal Issue
- 3
- Journal Page Range
- p. 264-267
- ISSN
- 0015-3222
- CODEN
- FTPPA4
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 30001545
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CARRIER DENSITY; CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY; ELECTRONS; HALL EFFECT; LEAD TELLURIDES; MAGNETIC FIELDS; MEV RANGE 01-10; PHYSICAL RADIATION EFFECTS; RADIATION FLUX; SOLID SOLUTIONS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0000-0013 K; TEMPERATURE RANGE 0013-0065 K; TEMPERATURE RANGE 0065-0273 K; TIN TELLURIDES
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL STRUCTURE; DISPERSIONS; ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; HOMOGENEOUS MIXTURES; LEAD COMPOUNDS; LEPTONS; MEV RANGE; MIXTURES; PHYSICAL PROPERTIES; RADIATION EFFECTS; SOLUTIONS; TELLURIDES; TELLURIUM COMPOUNDS; TEMPERATURE RANGE; TIN COMPOUNDS
Optional Information
- Notes
- 5 refs., 1 tab., 3 figs.