Published 1999
| Version v1
Miscellaneous
Application of thin window Si-detector to the detection of low Z elements in micro-PIXE
Description
no abstract available
Additional details
Publishing Information
- Imprint Title
- International conference on nuclear analytical methods in the life sciences (NAMLS) (abstracts)
- Imprint Pagination
- 177 p.
- Journal Page Range
- p. 29-30
Conference
- Title
- International conference on nuclear analytical methods in the life sciences (NAMLS)
- Dates
- 26-30 Oct 1998
- Place
- Beijing (China)
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 32015629
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature, No Abstract
- Descriptors DEI
- ATOMIC NUMBER; BIOLOGICAL MATERIALS; LI-DRIFTED DETECTORS; MEETINGS; MULTI-ELEMENT ANALYSIS; PIXE ANALYSIS; PROTON BEAMS; SENSITIVITY; X-RAY SPECTRA
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; MATERIALS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTRA; X-RAY EMISSION ANALYSIS