A Simple and High-performance Platform for Refractive Index Sensing based on Plasmonic Metal Disks on a Metal Mirror
- 1. School of Optoelectronic Information, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu 610054, China. (China)
- 2. iNANO Center, Aarhus University, Gustav Wieds vej 14, Aarhus 8000, Denmark. (Denmark)
Description
Numerical simulations are used to study light interactions with a platform composed of arrays of stacked metal and spacer dielectric disks on a continuous Au film. Tunable and high absorption is obtained near 1.6 μm by adjusting the thickness of the dielectric disks. Nearly perfect-absorption remains for a wide range of disk diameters. The near-perfect absorption is attributed to a magnetic resonance within the dielectric disks (combined with electric resonance at the metal disks) inducing the platform response to incident light. In addition, the resonance response to environment is more sensitive than that of metal disks on dielectric/metal films. Furthermore, when the diameter of the dielectric disks is reduced, the local electromagnetic field is more exposed and the refractive index sensitivity (RIS) increases to 1133nm/RIU (refractive index unit). The method is simple and effective to improve RIS of sandwich plasmonic structures and will be adopted in various plasmonic devices. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/484/1/012030Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 484
- Journal Issue
- 1
- Journal Page Range
- [5 p.]
- ISSN
- 1757-899X
Conference
- Title
- 5. Annual International Conference on Material Engineering and Application
- Acronym
- ICMEA 2018
- Dates
- 14-16 Dec 2018
- Place
- Wuhan (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52109603
- Subject category
- S36: MATERIALS SCIENCE; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; COMPUTERIZED SIMULATION; DIELECTRIC MATERIALS; ELECTRIC RESONANCE; ELECTROMAGNETIC FIELDS; MAGNETIC RESONANCE; METALS; MIRRORS; PERFORMANCE; REFRACTIVE INDEX; SENSITIVITY; SPACERS; THICKNESS; THIN FILMS
- Descriptors DEC
- DIMENSIONS; ELEMENTS; FILMS; MATERIALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RESONANCE; SIMULATION; SORPTION