Published March 1, 2019 | Version v1
Journal article

A Simple and High-performance Platform for Refractive Index Sensing based on Plasmonic Metal Disks on a Metal Mirror

  • 1. School of Optoelectronic Information, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu 610054, China. (China)
  • 2. iNANO Center, Aarhus University, Gustav Wieds vej 14, Aarhus 8000, Denmark. (Denmark)

Description

Numerical simulations are used to study light interactions with a platform composed of arrays of stacked metal and spacer dielectric disks on a continuous Au film. Tunable and high absorption is obtained near 1.6 μm by adjusting the thickness of the dielectric disks. Nearly perfect-absorption remains for a wide range of disk diameters. The near-perfect absorption is attributed to a magnetic resonance within the dielectric disks (combined with electric resonance at the metal disks) inducing the platform response to incident light. In addition, the resonance response to environment is more sensitive than that of metal disks on dielectric/metal films. Furthermore, when the diameter of the dielectric disks is reduced, the local electromagnetic field is more exposed and the refractive index sensitivity (RIS) increases to 1133nm/RIU (refractive index unit). The method is simple and effective to improve RIS of sandwich plasmonic structures and will be adopted in various plasmonic devices. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/484/1/012030

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
484
Journal Issue
1
Journal Page Range
[5 p.]
ISSN
1757-899X

Conference

Title
5. Annual International Conference on Material Engineering and Application
Acronym
ICMEA 2018
Dates
14-16 Dec 2018
Place
Wuhan (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52109603
Subject category
S36: MATERIALS SCIENCE; S42: ENGINEERING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; COMPUTERIZED SIMULATION; DIELECTRIC MATERIALS; ELECTRIC RESONANCE; ELECTROMAGNETIC FIELDS; MAGNETIC RESONANCE; METALS; MIRRORS; PERFORMANCE; REFRACTIVE INDEX; SENSITIVITY; SPACERS; THICKNESS; THIN FILMS
Descriptors DEC
DIMENSIONS; ELEMENTS; FILMS; MATERIALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RESONANCE; SIMULATION; SORPTION