Study of high quality 3D data acquisition in heavy ion CT using intensifying screen-EMCCD camera system
- 1. Kitasato Univ., Sagamihara, Kanagawa (Japan)
- 2. Ibaraki Prefectural Univ. of Health Science, Ami, Ibaraki (Japan)
Description
We have developed heavy ion computed tomography (HICT) system based on the measurement of residual range distribution using x-ray intensifying screen and charged coupled device (CCD) camera with Heavy Ion Medical Accelerator in Chiba (HIMAC) since 2000. In this system, there was the fluctuation of the beam-spill intensity as one of the problems which make the image quality poor. In order to improve it, the measurement of the beam intensity at every exposure is necessary to remove that affection. In 2008, we have developed the system which corrects projection data measured by HICT, using the monitoring information of the beam-spill. The fluctuation of beam intensity between each exposure was corrected, before the determination of the residual ranges. As a result, the fluctuation of range distribution decreased drastically. It was suggested that this correction was a useful method for the image quality improvement. (author)
Additional details
Identifiers
Publishing Information
- Imprint Title
- 2008 Annual report of the research project with heavy ions at NIRS-HIMAC
- Imprint Pagination
- 349 p.
- Journal Page Range
- p. 230-231
- Report number
- NIRS-M--226
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 53066882
- Subject category
- S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- CAMERAS; CARBON 12 BEAMS; CARBON IONS; CAT SCANNING; CHARGE-COUPLED DEVICES; DATA ACQUISITION; HEAVY IONS; HIMAC ACCELERATOR; IONIZATION CHAMBERS; PHANTOMS; PMMA; X RADIATION
- Descriptors DEC
- ACCELERATORS; BEAMS; CHARGED PARTICLES; COMPUTERIZED TOMOGRAPHY; CYCLIC ACCELERATORS; DATA PROCESSING; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; ESTERS; HEAVY ION ACCELERATORS; ION BEAMS; IONIZING RADIATIONS; IONS; MEASURING INSTRUMENTS; MOCKUP; ORGANIC COMPOUNDS; ORGANIC POLYMERS; POLYACRYLATES; POLYMERS; POLYVINYLS; PROCESSING; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DEVICES; STRUCTURAL MODELS; SYNCHROTRONS; TOMOGRAPHY
Optional Information
- Notes
- This record replaces 44074476