Published January 2015 | Version v1
Journal article

Behaviour of P, Si, Ni impurities and Cr in self ion irradiated Fe–Cr alloys – Comparison to neutron irradiation

Description

This paper presents an atom probe tomography study of phase transformation and solute segregation in Fe–Cr alloys of low purity under self-ion irradiation. Fe–9%Cr and Fe–12%Cr were irradiated at 100 °C, 300 °C and 420 °C at a dose of 0.5 dpa. Homogeneously distributed clusters enriched in Cr, P, Si and Ni are shown to form at 300 °C and 420 °C but not at 100 °C. Study of the evolution of the segregation intensities of Cr, Si and P in the clusters with temperature under ion irradiation indicates that they form by a radiation induced mechanism. No α′ clusters were observed whatever the irradiation temperature whereas they were observed in the same alloys after neutron irradiation at 300 °C at 0.6 dpa. Comparison of the solute cluster composition after ion irradiation and neutron irradiation, suggests that P atoms could play an important role in the appearance of the solute clusters by stabilizing point defect clusters that could later be enriched in Ni, Si and Cr

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jnucmat.2014.10.024

Additional details

Identifiers

DOI
10.1016/j.jnucmat.2014.10.024;
PII
S0022-3115(14)00708-9;

Publishing Information

Journal Title
Journal of Nuclear Materials
Journal Volume
456
Journal Page Range
p. 471-476
ISSN
0022-3115
CODEN
JNUMAM

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46113207
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALLOYS; COMPARATIVE EVALUATIONS; DOSES; IMPURITIES; NEUTRONS; PHASE TRANSFORMATIONS; POINT DEFECTS; SEGREGATION; SELF-IRRADIATION; SOLUTES; TOMOGRAPHY
Descriptors DEC
BARYONS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIAGNOSTIC TECHNIQUES; ELEMENTARY PARTICLES; EVALUATION; FERMIONS; HADRONS; IRRADIATION; NUCLEONS

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.