Behaviour of P, Si, Ni impurities and Cr in self ion irradiated Fe–Cr alloys – Comparison to neutron irradiation
Creators
Description
This paper presents an atom probe tomography study of phase transformation and solute segregation in Fe–Cr alloys of low purity under self-ion irradiation. Fe–9%Cr and Fe–12%Cr were irradiated at 100 °C, 300 °C and 420 °C at a dose of 0.5 dpa. Homogeneously distributed clusters enriched in Cr, P, Si and Ni are shown to form at 300 °C and 420 °C but not at 100 °C. Study of the evolution of the segregation intensities of Cr, Si and P in the clusters with temperature under ion irradiation indicates that they form by a radiation induced mechanism. No α′ clusters were observed whatever the irradiation temperature whereas they were observed in the same alloys after neutron irradiation at 300 °C at 0.6 dpa. Comparison of the solute cluster composition after ion irradiation and neutron irradiation, suggests that P atoms could play an important role in the appearance of the solute clusters by stabilizing point defect clusters that could later be enriched in Ni, Si and Cr
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jnucmat.2014.10.024Additional details
Identifiers
- DOI
- 10.1016/j.jnucmat.2014.10.024;
- PII
- S0022-3115(14)00708-9;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 456
- Journal Page Range
- p. 471-476
- ISSN
- 0022-3115
- CODEN
- JNUMAM
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46113207
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; COMPARATIVE EVALUATIONS; DOSES; IMPURITIES; NEUTRONS; PHASE TRANSFORMATIONS; POINT DEFECTS; SEGREGATION; SELF-IRRADIATION; SOLUTES; TOMOGRAPHY
- Descriptors DEC
- BARYONS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIAGNOSTIC TECHNIQUES; ELEMENTARY PARTICLES; EVALUATION; FERMIONS; HADRONS; IRRADIATION; NUCLEONS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.