Published April 2000 | Version v1
Journal article

Evidence of a critical film thickness for the early growth stage transition in YBa2Cu3O7-δ thin films

  • 1. Institute for Materials Science, George Washington University, Washington, DC 20006 (United States)
  • 2. Naval Research Laboratory, Washington, DC 20375 (United States)

Description

YBa2 Cu3 O7-δ thin films were grown by pulsed laser deposition on (100) SrTiO3 substrates with 0 and 5 deg. miscut angles along the [010] direction to observe and manipulate the growth at the early stages. For films on 0 deg miscut substrates, the first 30 A of growth was by island nucleation, and the areal density of nuclei increased with the film thickness. The transition from island nucleation to growth was between 30 and 60 A. Islands grew larger with the film thickness for films thicker than 30 A while the areal density was dramatically reduced. For the films on 5 deg. miscut substrates, the step-flow growth and island nucleation competed with each other for film thicknesses up to 30 A. When the film thickness increased above 60 A, the step-flow mode was dominant and no islands were observed. (author)

Additional details

Publishing Information

Journal Title
Superconductor Science and Technology (Online)
Journal Volume
13
Journal Issue
4
Journal Page Range
p. 417-420
ISSN
1361-6668

Optional Information

Notes
16 refs.; This record replaces 31030186