Controlled electropolishing of copper foils at elevated temperature
Creators
- 1. Department of Energy Science, Sungkyunkwan University, Suwon 440-746 (Korea, Republic of)
- 2. Department of Physics, Sungkyunkwan Advanced Institute of Nano-technology (SAINT), Sungkyunkwan University, Suwon 440-746 (Korea, Republic of)
- 3. IBS Center for Integrated Nanostructure Physics (CINAP), Institute of Basic Science (IBS), Daejeon (Korea, Republic of)
- 4. School of Mechanical Engineering, Sungkyunkwan University, Suwon 440-746 (Korea, Republic of)
Description
We have studied the electrochemical polishing of copper foils at elevated temperature, in H3PO4 electrolytes of various concentrations. Atomic force microscopy, surface reflectance measurements as well as optical microscopy and scanning electron microscopy (including electron backscattering diffraction) have been used throughout this study to characterize the surface of the electropolished foils. We have found that copper foils electropolished at 65 °C in 2.17 M H3PO4, exhibited a lower surface roughness and a higher percent specular reflection, comparing with values obtained after classical electropolishing in concentrated H3PO4 at room temperature or comparing with values obtained after chemical-mechanical polishing. This work could open up new prospects for the preparation of copper foils before the growth of high quality graphene layers.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2014.04.144Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2014.04.144;
- PII
- S0169-4332(14)00918-0;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 307
- Journal Page Range
- p. 731-735
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46029058
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; COPPER; ELECTROCHEMISTRY; ELECTROLYTES; ELECTRON DIFFRACTION; ELECTROPOLISHING; FOILS; GRAPHENE; LAYERS; MECHANICAL POLISHING; PHOSPHORIC ACID; REFLECTION; ROUGHNESS; SCANNING ELECTRON MICROSCOPY; SURFACES; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- CARBON; CHEMISTRY; COHERENT SCATTERING; DIFFRACTION; ELECTROLYSIS; ELECTRON MICROSCOPY; ELEMENTS; HYDROGEN COMPOUNDS; INORGANIC ACIDS; INORGANIC COMPOUNDS; LYSIS; METALS; MICROSCOPY; NONMETALS; OXYGEN COMPOUNDS; PHOSPHORUS COMPOUNDS; POLISHING; SCATTERING; SURFACE FINISHING; SURFACE PROPERTIES; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.