Single frequency stable VCSEL as a compact source for interferometry and vibrometry
Creators
- 1. Department of Field Theory, Electronic Systems and Optoelectronics, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27, 50320 Wroclaw (Poland)
Description
Developing an innovative PS-DAVLL (Polarization Switching DAVLL) method of frequency stabilization, which used a ferroelectric liquid crystal cell as quarter wave plate, rubidium cell and developed ultra-stable current source, allowed to obtain a frequency stability of 10-9(frequency reproducibility of 1,2·10-8) and reductions in external dimensions of laser source. The total power consumption is only 1,5 Watt. Because stabilization method used in the frequency standard is insensitive to vibration, the semiconductor laser interferometer was built for measuring range over one meter, which can also be used in industry for the accurate measurement of displacements with an accuracy of 1[μm/m]. Measurements of the VCSEL laser parameters are important from the standpoint of its use in laser interferometry or vibrometry, like narrow emission line ΔνFWHM = 70[MHz] equivalent of this laser type and stability of linear polarization of VCSEL laser. The undoubted advantage of the constructed laser source is the lack of mode-hopping effect during continuous work of VCSEL.
Additional details
Identifiers
- DOI
- 10.1063/1.3455472;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1253
- Journal Issue
- 1
- Journal Page Range
- p. 317-320
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 9. international conference on vibrational measurements by laser and non-contact techniques and short course
- Dates
- 22-25 Jun 2010
- Place
- Ancona (Italy)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41099018
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- FERROELECTRIC MATERIALS; FREQUENCY MEASUREMENT; INTERFEROMETERS; INTERFEROMETRY; LIQUID CRYSTALS; METERS; POLARIZATION; RUBIDIUM; SEMICONDUCTOR LASERS; STABILIZATION
- Descriptors DEC
- ALKALI METALS; CRYSTALS; DIELECTRIC MATERIALS; ELEMENTS; FLUIDS; LASERS; LIQUIDS; MATERIALS; MEASURING INSTRUMENTS; METALS; SEMICONDUCTOR DEVICES; SOLID STATE LASERS
Optional Information
- Notes
- (c) 2010 American Institute of Physics