Published May 28, 2010 | Version v1
Journal article

Single frequency stable VCSEL as a compact source for interferometry and vibrometry

  • 1. Department of Field Theory, Electronic Systems and Optoelectronics, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27, 50320 Wroclaw (Poland)

Description

Developing an innovative PS-DAVLL (Polarization Switching DAVLL) method of frequency stabilization, which used a ferroelectric liquid crystal cell as quarter wave plate, rubidium cell and developed ultra-stable current source, allowed to obtain a frequency stability of 10-9(frequency reproducibility of 1,2·10-8) and reductions in external dimensions of laser source. The total power consumption is only 1,5 Watt. Because stabilization method used in the frequency standard is insensitive to vibration, the semiconductor laser interferometer was built for measuring range over one meter, which can also be used in industry for the accurate measurement of displacements with an accuracy of 1[μm/m]. Measurements of the VCSEL laser parameters are important from the standpoint of its use in laser interferometry or vibrometry, like narrow emission line ΔνFWHM = 70[MHz] equivalent of this laser type and stability of linear polarization of VCSEL laser. The undoubted advantage of the constructed laser source is the lack of mode-hopping effect during continuous work of VCSEL.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1253
Journal Issue
1
Journal Page Range
p. 317-320
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
9. international conference on vibrational measurements by laser and non-contact techniques and short course
Dates
22-25 Jun 2010
Place
Ancona (Italy)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41099018
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FERROELECTRIC MATERIALS; FREQUENCY MEASUREMENT; INTERFEROMETERS; INTERFEROMETRY; LIQUID CRYSTALS; METERS; POLARIZATION; RUBIDIUM; SEMICONDUCTOR LASERS; STABILIZATION
Descriptors DEC
ALKALI METALS; CRYSTALS; DIELECTRIC MATERIALS; ELEMENTS; FLUIDS; LASERS; LIQUIDS; MATERIALS; MEASURING INSTRUMENTS; METALS; SEMICONDUCTOR DEVICES; SOLID STATE LASERS

Optional Information

Notes
(c) 2010 American Institute of Physics