Published March 2007
| Version v1
Journal article
Comparison of femtosecond and nanosecond laser-induced damage in HfO2 single-layer film and HfO2-SiO2 high reflector
Creators
- 1. Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800 (China)
- 2. Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800 (China) and Graduate School of the Chinese Academy of Sciences, Beijing 100039 (China)
Description
HfO2 single layers, 800 nm high-reflective (HR) coating, and 1064 nm HR coating were prepared by electron-beam evaporation. The laser-induced damage thresholds (LIDTs) and damage morphologies of these samples were investigated with single-pulse femtosecond and nanosecond lasers. It is found that the LIDT of the HfO2 single layer is higher than the HfO2-SiO2 HR coating in the femtosecond regime, while the situation is opposite in the nanosecond regime. Different damage mechanisms are applied to study this phenomenon. Damage morphologies of all samples due to different laser irradiations are displayed
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of the Optical Society of America. Part B, Optical Physics
- Journal Volume
- 24
- Journal Issue
- 3
- Journal Page Range
- p. 538-543
- ISSN
- 0740-3224
- CODEN
- JOBPDE
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38088209
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S36: MATERIALS SCIENCE;
- Descriptors DEI
- DAMAGE; ELECTRON BEAMS; EVAPORATION; HAFNIUM OXIDES; LASER RADIATION; LASERS; LAYERS; MORPHOLOGY; PULSES; SILICON OXIDES; THIN FILMS; VACUUM COATING
- Descriptors DEC
- BEAMS; CHALCOGENIDES; DEPOSITION; ELECTROMAGNETIC RADIATION; FILMS; HAFNIUM COMPOUNDS; LEPTON BEAMS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PHASE TRANSFORMATIONS; RADIATIONS; REFRACTORY METAL COMPOUNDS; SILICON COMPOUNDS; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2007 Optical Society of America