Published October 1, 2010 | Version v1
Journal article

Influence of thickness, width and temperature on critical current density of Nb thin film structures

  • 1. Institute for Micro- and Nano-Electronic Systems, Karlsruhe Institute of Technology, Hertzstrasse 16, 76187 Karlsruhe (Germany)
  • 2. Light Technology Institute, Karlsruhe Institute of Technology, Engesserstrasse 13, 76131 Karlsruhe (Germany)
  • 3. Physics Institute, University of Zurich, Winterthurerstrasse 190, 8057 Zurich (Switzerland)
  • 4. DLR e.V. Institute of Planetary Research, Rutherfordstrasse 2, 12489 Berlin-Adlershof (Germany)

Description

The density of critical currents jC in Nb thin films with thickness smaller than 15 nm and width between 100 nm and 10 μm has been measured in a wide temperature range. We have found that the temperature dependencies of jC in sub-micrometer wide bridges at 0.7TC < T < TC are well described by the Ginzburg-Landau de-pairing critical current. In wider bridges already at T < 0.9TC the jC value is significantly reduced due to the penetration and de-pinning of magnetic vortices.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physc.2010.02.042

Additional details

Identifiers

DOI
10.1016/j.physc.2010.02.042;
PII
S0921-4534(10)00149-8;

Publishing Information

Journal Title
Physica. C, Superconductivity
Journal Volume
470
Journal Issue
19
Journal Page Range
p. 953-956
ISSN
0921-4534
CODEN
PHYCE6

Conference

Title
6. international conference in school format on vortex matter in nanostructured superconductors
Acronym
VORTEX VI
Dates
17-24 Sep 2009
Place
Rhodes (Greece)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42000703
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRITICAL CURRENT; CURRENT DENSITY; DENSITY; GINZBURG-LANDAU THEORY; MAGNETIC FLUX; NIOBIUM; SUPERCONDUCTING FILMS; TEMPERATURE DEPENDENCE; THICKNESS; THIN FILMS
Descriptors DEC
CURRENTS; DIMENSIONS; ELECTRIC CURRENTS; ELEMENTS; FILMS; METALS; PHYSICAL PROPERTIES; REFRACTORY METALS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.