Published October 1, 2010
| Version v1
Journal article
Influence of thickness, width and temperature on critical current density of Nb thin film structures
- 1. Institute for Micro- and Nano-Electronic Systems, Karlsruhe Institute of Technology, Hertzstrasse 16, 76187 Karlsruhe (Germany)
- 2. Light Technology Institute, Karlsruhe Institute of Technology, Engesserstrasse 13, 76131 Karlsruhe (Germany)
- 3. Physics Institute, University of Zurich, Winterthurerstrasse 190, 8057 Zurich (Switzerland)
- 4. DLR e.V. Institute of Planetary Research, Rutherfordstrasse 2, 12489 Berlin-Adlershof (Germany)
Description
The density of critical currents jC in Nb thin films with thickness smaller than 15 nm and width between 100 nm and 10 μm has been measured in a wide temperature range. We have found that the temperature dependencies of jC in sub-micrometer wide bridges at 0.7TC < T < TC are well described by the Ginzburg-Landau de-pairing critical current. In wider bridges already at T < 0.9TC the jC value is significantly reduced due to the penetration and de-pinning of magnetic vortices.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physc.2010.02.042Additional details
Identifiers
- DOI
- 10.1016/j.physc.2010.02.042;
- PII
- S0921-4534(10)00149-8;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 470
- Journal Issue
- 19
- Journal Page Range
- p. 953-956
- ISSN
- 0921-4534
- CODEN
- PHYCE6
Conference
- Title
- 6. international conference in school format on vortex matter in nanostructured superconductors
- Acronym
- VORTEX VI
- Dates
- 17-24 Sep 2009
- Place
- Rhodes (Greece)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42000703
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRITICAL CURRENT; CURRENT DENSITY; DENSITY; GINZBURG-LANDAU THEORY; MAGNETIC FLUX; NIOBIUM; SUPERCONDUCTING FILMS; TEMPERATURE DEPENDENCE; THICKNESS; THIN FILMS
- Descriptors DEC
- CURRENTS; DIMENSIONS; ELECTRIC CURRENTS; ELEMENTS; FILMS; METALS; PHYSICAL PROPERTIES; REFRACTORY METALS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.