The multiphase Thomson scattering diagnostic on the DIII-D tokamak
Creators
- 1. General Atomic Co., San Diego, CA (United States)
Description
This paper describes the design and operation of a 40-spatial channel Thomson scattering system that uses multiple 20 Hz Nd:YAG lasers to measure the electron temperature and density profiles periodically throughout an entire plasma discharge. Interference filter polychromators disperse the scattered light which is detected by silicon avalanche photodiodes. The measurable temperature range is from 10 eV to 20 keV and the minimum detectable density is about 2 x 1018mminus3. Laser control and data acquisition are performed in real-time by a vME-based microcomputer. Data analysis is performed by a MicroVAX 3400. Unique features of this system include burst mode operation, where multiple lasers are fired in rapid succession (<10 kHz), real-time analysis capability, and laser beam quality and alignment monitoring during plasma operation. Results of component testing, calibration, and plasma operation are presented
Additional details
Publishing Information
- Publisher
- IEEE Service Center.
- Imprint Place
- Piscataway, NJ (UNITED STATES)
- ISBN
- 0-7803-0132-3
- Imprint Title
- Proceedings of fusion engineering
- Imprint Pagination
- 1236 p.
- Journal Page Range
- p. 1195-1198.
Conference
- Title
- 14. IEEE symposium on fusion engineering.
- Dates
- 30 Sep - 3 Oct 1991.
- Place
- San Diego, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24055721
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DATA ACQUISITION SYSTEMS; ELECTRON TEMPERATURE; NEODYMIUM LASERS; PERFORMANCE TESTING; PHOTODIODES; PLASMA DENSITY; PLASMA DIAGNOSTICS; PLASMA RADIAL PROFILES; REACTOR COMPONENTS; REAL TIME SYSTEMS; THOMSON SCATTERING; TOKAMAK DEVICES
- Descriptors DEC
- AMPLIFIERS; CLOSED PLASMA DEVICES; EQUIPMENT; INELASTIC SCATTERING; LASERS; SCATTERING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SOLID STATE LASERS; TESTING; THERMONUCLEAR DEVICES
Optional Information
- Secondary number(s)
- CONF-910968--.