Published January 2021
| Version v1
Journal article
Effect of dislocation configuration on Ag segregation in subgrain boundary of a Mg-Ag alloy
Creators
- 1. Nano and Heterogeneous Material Center, Nanjing University of Science and Technology, Nanjing, 210094 (China)
- 2. Institute of Mechanics, Chinese Academy of Sciences, Beijing, 100190 (China)
- 3. School of Materials Science and Engineering, Southwest Jiaotong University, Sichuan 610031 (China)
- 4. Ansteel Beijing Research Institute Co., Ltd., Beijing, 102209 (China)
- 5. Department of Materials Science & Engineering, North Carolina State University, Raleigh, NC 27695 (United States)
Description
Interfacial segregation has been reported to play a critical role in the thermal-mechanical stability of nanocrystalline Mg alloys. Here we report Ag-segregation-assisted formation of nanocrystalline Mg-Ag alloy with high proportion of sub-grain boundaries during conventional rolling. The segregation structure is determined by dislocation configurations and subsequent strain field and misorientation of the sub-grain boundary. It indicates that the alloying elements, which induce dislocations, would help to improve the stability of interfaces.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2020.08.040Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2020.08.040;
- PII
- S1359646220305662;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 191
- Journal Page Range
- p. 219-224
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53120245
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; CRYSTALS; DISLOCATIONS; GRAIN BOUNDARIES; INTERFACES; NANOSTRUCTURES; SEGREGATION; STABILITY
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; LINE DEFECTS; MICROSTRUCTURE
Optional Information
- Copyright
- Copyright (c) 2020 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.