Published October 12, 2015 | Version v1
Journal article

Development of a cryo-FIB technique for the 3D structural characterization of liquid samples

  • 1. Hitachi High-technologies Europe GmbH, Europark Fichtenhain A 12, 47807 Krefeld (Germany)
  • 2. Hitachi High-Tech Science Corp., 36-1, Takenoshita, Oyama-cho, Shizuoka, 410-1393 Japan (Japan)
  • 3. Hitachi High-Technologies Corp., 1040 Ichige, Hitachinaka, Ibaraki, 312-0033 Japan (Japan)

Description

The observation of three-dimensional distributions in some liquids or colloids is important, for example in cosmetics, functional paints and a catalyst. Furthermore, there is increasing demand to microscopically investigate the structures inside a liquid colloid, such as the interface of a dispersoid and dispersant. In order to meet these requirements, we have developed a cryo-transfer holder which is fully compatible between FIB and TEM/STEM. The cross section of frozen emulsions and a thin film sample were made by FIB-SEM (NB5000). As a result, the dispersion state of a dispersoid was observed by sequential FIB and SEM. Furthermore a 100nm thick sample was made by FIB and observed by 200 kV STEM (HD- 2700). The dispersoid (TiO2 and Fe2O3) morphology and distribution were shown at nanometer level. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/644/1/012014

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
644
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
Electron Microscopy and Analysis Group conference
Acronym
EMAG2015
Dates
29 Jun - 2 Jul 2015
Place
Manchester (United Kingdom)