Development of a cryo-FIB technique for the 3D structural characterization of liquid samples
- 1. Hitachi High-technologies Europe GmbH, Europark Fichtenhain A 12, 47807 Krefeld (Germany)
- 2. Hitachi High-Tech Science Corp., 36-1, Takenoshita, Oyama-cho, Shizuoka, 410-1393 Japan (Japan)
- 3. Hitachi High-Technologies Corp., 1040 Ichige, Hitachinaka, Ibaraki, 312-0033 Japan (Japan)
Description
The observation of three-dimensional distributions in some liquids or colloids is important, for example in cosmetics, functional paints and a catalyst. Furthermore, there is increasing demand to microscopically investigate the structures inside a liquid colloid, such as the interface of a dispersoid and dispersant. In order to meet these requirements, we have developed a cryo-transfer holder which is fully compatible between FIB and TEM/STEM. The cross section of frozen emulsions and a thin film sample were made by FIB-SEM (NB5000). As a result, the dispersion state of a dispersoid was observed by sequential FIB and SEM. Furthermore a 100nm thick sample was made by FIB and observed by 200 kV STEM (HD- 2700). The dispersoid (TiO2 and Fe2O3) morphology and distribution were shown at nanometer level. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/644/1/012014Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 644
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- Electron Microscopy and Analysis Group conference
- Acronym
- EMAG2015
- Dates
- 29 Jun - 2 Jul 2015
- Place
- Manchester (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47108101
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRONS; EMULSIONS; INTERFACES; IRON OXIDES; LIQUIDS; MORPHOLOGY; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COLLOIDS; DISPERSIONS; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; FERMIONS; FILMS; FLUIDS; IRON COMPOUNDS; LEPTONS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS