Published June 1, 1987 | Version v1
Journal article

Resolution corrections in diffuse scattering experiments

  • 1. Muenchen Univ. (Germany, F.R.). Inst. fuer Kristallographie und Mineralogie

Description

The variation of diffuse scattered intensities with scattering angle due to resolution effects is described by different Lorentz factors depending on the dimensionality of the disorder (e.g. diffuse streaks or planes) and the type of scan. Intensities are calculated by folding the cross section of the diffuse scattering with the resolution function of the instrument. For the most general result existing calculations of the resolution function are extended to include (I) a characteristic line spectrum used together with a monochromator, (II) a possible mis-set of the monochromator (e.g. between Kα1 and Kα2) and (III) a perpendicular arrangement of the scattering planes at the monochromator and at the sample. Both a Gaussian and a slightly simplified rectangular approximation have been applied. Explicit formulae are derived for sharp diffuse streaks and planes for a point measurement as well as integrated intensities. Since the evaluation of point measurements requires exact knowledge of the instrumental divergences and, moreover, there are differences between the two approximations, it is strongly recommended that integrated intensities be used, preferably from scans perpendicular to the streak or plane. (orig.)

Additional details

Publishing Information

Journal Title
J. Appl. Crystallogr.
Journal Volume
20
Journal Issue
3
Series
J. Appl. Crystallogr.
Journal Page Range
200-209
ISSN
0021-8898
CODEN
JACGA

Optional Information

Contract/Grant/Project number
Contract BMFT 03-41 E12