Published December 2005
| Version v1
Journal article
Fabrication and characterization of Zn-doped CdTe nanowires
- 1. Chinese Academy of Science, Nano-organic Photoelectronic Laboratory, Technical Institute of Physics and Chemistry, P.O. Box 5100, Beijing (China)
- 2. City University of Hong Kong, Center of Super-Diamond and Advanced Films and Department of Physics and Materials Science, Hong Kong, SAR (China)
Description
At 850 C, Zn-doped CdTe nanowires with an average diameter of about 40 nm and lengths up to several tens of micrometers were fabricated by a CVD approach. The nanowires were detected by SEM, XRD, TEM, HRTEM, EDS, SAED, and XPS, where the as-synthesized CdZnTe nanowires have high-quality crystalline structure and grow along the left angle 001 right angle direction and the Cd/Zn ratios of these nanowires are close to those expected from the starting compositions. The corresponding growth mechanism of the nanowires is also explained. (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1007/s00339-005-3334-xAdditional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing
- Journal Volume
- 81
- Journal Issue
- 8
- Series
- Special issue on ''metal nanowires''
- Journal Page Range
- p. 1647-1650
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 37002896
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BINDING ENERGY; CADMIUM TELLURIDES; CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; DOPED MATERIALS; ELECTRON DIFFRACTION; ELECTRON SPECTRA; EMISSION SPECTRA; ENERGY SPECTRA; FABRICATION; PHOTOELECTRIC EMISSION; QUANTUM WIRES; SCANNING ELECTRON MICROSCOPY; SMALL ANGLE SCATTERING; TEMPERATURE RANGE 1000-4000 K; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY SPECTRA; ZINC ADDITIONS; ZINC TELLURIDES
- Descriptors DEC
- ALLOYS; CADMIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL COATING; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRON EMISSION; ELECTRON MICROSCOPY; EMISSION; ENERGY; MATERIALS; MICROSCOPY; NANOSTRUCTURES; PHOTOELECTRIC EFFECT; SCATTERING; SPECTRA; SURFACE COATING; TELLURIDES; TELLURIUM COMPOUNDS; TEMPERATURE RANGE; ZINC ALLOYS; ZINC COMPOUNDS