Ferromagnetic resonance in ferromagnetic/antiferromagnetic bilayers under the stress field
Creators
- 1. College of Physics Science and Technology, Yangzhou University, Yangzhou 225002 (China)
- 2. School of Physics, M013, University of Western Australia, 35 Stirling Highway, Crawley, WA 6009 (Australia)
Description
Based on the energy of equilibrium, the ferromagnetic resonance for ferromagnetic (FM)/antiferromagnetic (AFM) bilayers under the stress field is studied by using Smith and Beljers's method. The thin FM film is taken to be a single crystal with cubic and uniaxial magnetocrystalline anisotropies, while the thickness of AFM layer is semi-infinite but with single uniaxial magnetocrystalline anisotropies. Numerical calculations show that there are two branches for FM resonance modes divided by the critical field, which distinguishes the weak and strong external field. The critical field depends on the direction of stress field and the interfacial 'turning' coefficient. Interestingly, the stress field and the interfacial 'turning' coefficient both affect FM resonance only under the weak magnetic field. On the other hand, the variety of the stress field angle can alter the direction of magnetocrystalline anisotropies axis of FM layer
Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2006.05.023;
- PII
- S0375-9601(06)00744-4;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 358
- Journal Issue
- 3
- Journal Page Range
- p. 236-241
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38067182
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ANISOTROPY; ANTIFERROMAGNETISM; CRITICAL FIELD; EQUILIBRIUM; FERROMAGNETIC RESONANCE; FILMS; LAYERS; MONOCRYSTALS; THICKNESS
- Descriptors DEC
- CRYSTALS; DIMENSIONS; MAGNETIC FIELDS; MAGNETIC RESONANCE; MAGNETISM; RESONANCE
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.