Published October 16, 2006 | Version v1
Journal article

Ferromagnetic resonance in ferromagnetic/antiferromagnetic bilayers under the stress field

  • 1. College of Physics Science and Technology, Yangzhou University, Yangzhou 225002 (China)
  • 2. School of Physics, M013, University of Western Australia, 35 Stirling Highway, Crawley, WA 6009 (Australia)

Description

Based on the energy of equilibrium, the ferromagnetic resonance for ferromagnetic (FM)/antiferromagnetic (AFM) bilayers under the stress field is studied by using Smith and Beljers's method. The thin FM film is taken to be a single crystal with cubic and uniaxial magnetocrystalline anisotropies, while the thickness of AFM layer is semi-infinite but with single uniaxial magnetocrystalline anisotropies. Numerical calculations show that there are two branches for FM resonance modes divided by the critical field, which distinguishes the weak and strong external field. The critical field depends on the direction of stress field and the interfacial 'turning' coefficient. Interestingly, the stress field and the interfacial 'turning' coefficient both affect FM resonance only under the weak magnetic field. On the other hand, the variety of the stress field angle can alter the direction of magnetocrystalline anisotropies axis of FM layer

Additional details

Identifiers

DOI
10.1016/j.physleta.2006.05.023;
PII
S0375-9601(06)00744-4;

Publishing Information

Journal Title
Physics Letters. A
Journal Volume
358
Journal Issue
3
Journal Page Range
p. 236-241
ISSN
0375-9601
CODEN
PYLAAG

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38067182
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ANISOTROPY; ANTIFERROMAGNETISM; CRITICAL FIELD; EQUILIBRIUM; FERROMAGNETIC RESONANCE; FILMS; LAYERS; MONOCRYSTALS; THICKNESS
Descriptors DEC
CRYSTALS; DIMENSIONS; MAGNETIC FIELDS; MAGNETIC RESONANCE; MAGNETISM; RESONANCE

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.