Published May 15, 2000 | Version v1
Journal article

Electron beam lithography of Fresnel zone plates using a rectilinear machine and trilayer resists

  • 1. Lucent Technologies Bell Laboratories (United States)
  • 2. Department of Physics and Astronomy, SUNY Stony Brook (United States)

Description

We describe the use of a commercial e-beam lithography system (JEOL JBX-6000FS) to fabricate Fresnel zone plates for x-ray microscopy. The machine is capable of controlling the pitch of optical gratings with sub-nanometer precision, so its beam placement properties are more than adequate for zone plate fabrication. The zone plate pattern is written into a thin top layer (PMMA or Calixarene) of a trilayer resist, and transferred into thick nickel zones using reactive ion etching (RIE) followed by electroplating. Zone plates with outermost zone widths of 30 nm have exhibited efficiencies up to 10.0% at a 390 eV photon energy and with diameters in the range 80 to 120 μm. Zone plates with outer zones of 18 to 20 nm were also fabricated in thinner Ni with correspondingly lower efficiencies of 2.6%. Zone plates with outermost zone widths of 45 nm have been fabricated with larger diameters up to 160 μm. All results reported were obtained with a 50 kV system with 80 μm field deflection size; future efforts will make use of a 100 kV, 500 μm field size system

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
507
Journal Issue
1
Journal Page Range
p. 601-606
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
6. international conference on X-ray microscopy
Dates
2-6 Aug 1999
Place
Berkeley, CA (United States)

Optional Information

Notes
(c) 2000 American Institute of Physics.