Electron beam lithography of Fresnel zone plates using a rectilinear machine and trilayer resists
Creators
- 1. Lucent Technologies Bell Laboratories (United States)
- 2. Department of Physics and Astronomy, SUNY Stony Brook (United States)
Description
We describe the use of a commercial e-beam lithography system (JEOL JBX-6000FS) to fabricate Fresnel zone plates for x-ray microscopy. The machine is capable of controlling the pitch of optical gratings with sub-nanometer precision, so its beam placement properties are more than adequate for zone plate fabrication. The zone plate pattern is written into a thin top layer (PMMA or Calixarene) of a trilayer resist, and transferred into thick nickel zones using reactive ion etching (RIE) followed by electroplating. Zone plates with outermost zone widths of 30 nm have exhibited efficiencies up to 10.0% at a 390 eV photon energy and with diameters in the range 80 to 120 μm. Zone plates with outer zones of 18 to 20 nm were also fabricated in thinner Ni with correspondingly lower efficiencies of 2.6%. Zone plates with outermost zone widths of 45 nm have been fabricated with larger diameters up to 160 μm. All results reported were obtained with a 50 kV system with 80 μm field deflection size; future efforts will make use of a 100 kV, 500 μm field size system
Additional details
Identifiers
- DOI
- 10.1063/1.1291218;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 507
- Journal Issue
- 1
- Journal Page Range
- p. 601-606
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 6. international conference on X-ray microscopy
- Dates
- 2-6 Aug 1999
- Place
- Berkeley, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35070030
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; EFFICIENCY; ELECTRON BEAMS; ELECTROPLATING; ETCHING; FABRICATION; FRESNEL LENS; INTEGRATED CIRCUITS; NICKEL; PHOTONS; PLATES; PMMA; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; WIDTH; X RADIATION; X-RAY DIFFRACTION; ZONES
- Descriptors DEC
- BEAMS; BOSONS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; DIMENSIONS; ELECTRODEPOSITION; ELECTROLYSIS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRONIC CIRCUITS; ELEMENTARY PARTICLES; ELEMENTS; ESTERS; IONIZING RADIATIONS; LENSES; LEPTON BEAMS; LYSIS; MASSLESS PARTICLES; METALS; MICROELECTRONIC CIRCUITS; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PARTICLE BEAMS; PLATING; POLYACRYLATES; POLYMERS; POLYVINYLS; RADIATIONS; SCATTERING; SURFACE COATING; SURFACE FINISHING; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2000 American Institute of Physics.