Published July 2007
| Version v1
Journal article
Erratum: 'In situ microtensile stage for electromechanical characterization of nanoscale freestanding films' [Rev. Sci. Instrum. 77, 045102 (2006)]
Creators
- 1. Department of Mechanical and Industrial Engineering, University of Illinois at Urbana-Champaign, 1206 West Green Street, Urbana, Illinois 61801 (United States)
Description
no abstract available
Additional details
Identifiers
- DOI
- 10.1063/1.2751098;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 78
- Journal Issue
- 7
- Journal Page Range
- p. 079901-079901.1
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38104825
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- ALUMINIUM; DEPOSITION; ELECTRIC CONDUCTIVITY; GRAIN SIZE; NANOSTRUCTURES; THIN FILMS
- Descriptors DEC
- ELECTRICAL PROPERTIES; ELEMENTS; FILMS; METALS; MICROSTRUCTURE; PHYSICAL PROPERTIES; SIZE
Optional Information
- Notes
- (c) 2007 American Institute of Physics