Published June 1974 | Version v1
Book Metadata-only

Irradiation tests on COSMOS integrated circuits using a Sr source

Creators

  • 1. Centre National d'Etudes Spatiales, 31 - Toulouse (France)

Description

Comparative tests between two irradiations modes were performed. Structures used for testing these modes are C.MOS integrated circuits. With the help of electrical parameters the most significant observed drifts on each lot of components are described. Conclusions relate on the one hand the behavior of the components under irradiations and on the other hand advantages and disadvantages of the modes used

Abstract (French)

Des essais comparatifs entre deux modes d'irradiations ont eu lieu. Les structures utilisees pour tester ces moyens sont des circuits integres logiques a MOS complementaires. On decrit a l'aide des parametres electriques les plus singnificatifs les evolutions observees sur chacun des lots de composants. Les conclusions mettent en relief d'une part la tenue aux irradiations constatee sur les composants eux-memes et d'autre part les avantages et les inconvenients des procedures utilisees

Additional details

Additional titles

Original title (French)
Essais d'irradiation sur des circuits COSMOS avec une source au strontium

Publishing Information

Publisher
Centre National d'Etudes Spatiales.
Imprint Place
Toulouse, France
Imprint Title
Evaluation of space environment on materials. International conference, Toulouse, June 17-21, 1974
Imprint Pagination
p. 737-754.

Conference

Title
International conference on evaluation of space environment on materials.
Dates
17 Jun 1974.
Place
Toulouse, France.

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
7237966
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON BEAMS; INTEGRATED CIRCUITS; MOS TRANSISTORS; PHYSICAL RADIATION EFFECTS
Descriptors DEC
BEAMS; ELECTRONIC CIRCUITS; LEPTON BEAMS; PARTICLE BEAMS; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; TRANSISTORS

Optional Information

Notes
Imprint:Evaluation de l'action de l'environnement spatial sur les materiaux. Colloque international, Toulouse, 17-21 juin 1974.