Deterministic measurement of the Purcell factor in microcavities through Raman emission

We show that a deterministic value and measurement of the Purcell factor in a semiconductor microcavity can be obtained by using spontaneous Raman scattering as an internal source. In this case the emitter characteristics are entirely determined by the cavity design and do not depend on uncontrolled random factors, as it is usually the case when quantum dot emitters are used. We derive a theoretical expression for the Purcell factor of the cavity in the particular case of Raman scattering, in very good agreement with the experimental measurement.