Published October 1984 | Version v1
Journal article

Behaviour of point defects under irradiation

  • 1. Moskovskij Inst. Ehlektronnoj Tekhniki (USSR)

Description

The relation between the amorphization processes in semiconductors under irradiation and the phenomenon of a loss instability in a system of radiation defects has been discussed. (author)

Additional details

Publishing Information

Journal Title
Radiat. Eff. Lett.
Journal Issue
v, 85(2
Series
Radiat. Eff. Lett.
ISSN
0142-2448