Published February 2012
| Version v1
Journal article
First measurement of electron temperature from signal ratios in a double-pass Thomson scattering system
- 1. Japan Atomic Energy Agency, 801-1 Mukoyama, Naka 311-0193 (Japan)
- 2. Graduate School of Frontier Sciences, University of Tokyo, Kashiwa 277-8561 (Japan)
- 3. Graduate School of Science, University of Tokyo, Tokyo 113-0033 (Japan)
Description
This paper presents an experimental demonstration to determine electron temperature (Te) with unknown spectral sensitivity (transmissivity) in a Thomson scattering system. In this method, a double-pass scattering configuration is used and the scattered lights from each pass (with different scattering angles) are measured separately. Te can be determined from the ratio of the signal intensities without knowing a real chromatic dependence in the sensitivity. Note that the wavelength range for each spectral channel must be known. This method was applied to the TST-2 Thomson scattering system. As a result, Te measured from the ratio (Te,r) and Te measured from a standard method (Te,s) showed a good agreement with <|Te,r-Te,s|/Te,s>= 7.3%.
Additional details
Identifiers
- DOI
- 10.1063/1.3685612;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 83
- Journal Issue
- 2
- Journal Page Range
- p. 023507-023507.4
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44023016
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ELECTRON TEMPERATURE; LIGHT SCATTERING; MEASURING METHODS; SENSITIVITY; SIGNALS; TEMPERATURE MEASUREMENT; THOMSON SCATTERING; WAVELENGTHS
- Descriptors DEC
- INELASTIC SCATTERING; SCATTERING
Optional Information
- Notes
- (c) 2012 American Institute of Physics