Published February 2012 | Version v1
Journal article

First measurement of electron temperature from signal ratios in a double-pass Thomson scattering system

  • 1. Japan Atomic Energy Agency, 801-1 Mukoyama, Naka 311-0193 (Japan)
  • 2. Graduate School of Frontier Sciences, University of Tokyo, Kashiwa 277-8561 (Japan)
  • 3. Graduate School of Science, University of Tokyo, Tokyo 113-0033 (Japan)

Description

This paper presents an experimental demonstration to determine electron temperature (Te) with unknown spectral sensitivity (transmissivity) in a Thomson scattering system. In this method, a double-pass scattering configuration is used and the scattered lights from each pass (with different scattering angles) are measured separately. Te can be determined from the ratio of the signal intensities without knowing a real chromatic dependence in the sensitivity. Note that the wavelength range for each spectral channel must be known. This method was applied to the TST-2 Thomson scattering system. As a result, Te measured from the ratio (Te,r) and Te measured from a standard method (Te,s) showed a good agreement with <|Te,r-Te,s|/Te,s>= 7.3%.

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
83
Journal Issue
2
Journal Page Range
p. 023507-023507.4
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44023016
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ELECTRON TEMPERATURE; LIGHT SCATTERING; MEASURING METHODS; SENSITIVITY; SIGNALS; TEMPERATURE MEASUREMENT; THOMSON SCATTERING; WAVELENGTHS
Descriptors DEC
INELASTIC SCATTERING; SCATTERING

Optional Information

Notes
(c) 2012 American Institute of Physics