Published August 2005
| Version v1
Journal article
Irradiation induced defects in nanocrystalline Cu
- 1. Department of Electronic Materials Engineering, Australian National University, Canberra, ACT 0200 (Australia)
- 2. Australian Nuclear Science and Technology Organization, Menai (Australia)
Description
Cu nanocrystals were synthesized in a thin layer of amorphous silica (SiO2) by ion implantation and thermal annealing. Subsequently the nanocrystals and a bulk Cu film standard were irradiated with high-energy Sn ions to induce structural disorder. We quantify the disorder by extended X-ray absorption fine structure (EXAFS) spectroscopy. Irradiation is found to increase the structural disorder in the nanocrystals, while the structural parameters of the irradiated film remain the same as those for the unirradiated crystalline standard. We explain this difference by the high regeneration rate in elemental bulk metals and the effect thereupon of a finite crystal size
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.06.063;
- PII
- S0168-583X(05)01000-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 238
- Journal Issue
- 1-4
- Journal Page Range
- p. 276-280
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 4. conference on synchrotron radiation in materials science
- Dates
- 23-25 Aug 2004
- Place
- Grenoble (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37024981
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ANNEALING; DEFECTS; FINE STRUCTURE; ION IMPLANTATION; IRRADIATION; METALS; NANOSTRUCTURES; SILICA; SILICON OXIDES; THIN FILMS; TIN IONS; X RADIATION; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; HEAT TREATMENTS; IONIZING RADIATIONS; IONS; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SILICON COMPOUNDS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.