Published 2001 | Version v1
Miscellaneous

The influence of constructional and technological factors on electrooptical parameters of thick-film electroluminescent layers

  • 1. Research and Development Centre for Hybrid Microelectronics and Resistors, Cracow (Poland)

Description

no abstract available

Part of:
Proceedings of 25. International Conference IMAPS - Poland 2001

Additional details

Publishing Information

Imprint Title
Proceedings of 25. International Conference IMAPS - Poland 2001
Imprint Pagination
330 p.
Journal Page Range
p. 179-182

Conference

Title
25. International Conference IMAPS - Poland 2001
Dates
26-29 Sep 2001
Place
Rzeszow-Polanczyk (Poland)

Optional Information

Notes
6 refs, 6 figs, 1 tab