Structure and dielectric properties of novel series of 3CaO–RE2O3–2WO3 (RE = La, Nd and Sm) microwave ceramics and the adjustment of τf value
Creators
- 1. Guilin University of Technology. Guangxi Ministry-Province Jointly-Constructed Cultivation Base for State Key Laboratory of Processing for Non-Ferrous Metal and Featured Materials, Guangxi Key Laboratory in Collaborative Innovation Center for Exploration of Hidden Nonferrous Metal Deposits and Development of New Materials in Guangxi, School of Materials Science and Engineering (China)
Description
Using the solid-state reaction method, novel series of 3CaO–RE2O3–2WO3 (RE = La, Nd and Sm) dielectric ceramics materials were fabricated, and the crystal structure and microstructure were studied through X-ray diffraction (XRD) and scanning electron microscope (SEM), respectively. The Ca3La2W2O12 (CLW) ceramic exhibited a single pure phase with a rhombohedral structure, and Ca3Nd2W2O12 (CNW) and Ca3Sm2W2O12 (CSW) ceramics had similar crystal structures with CLW. 3CaO–RE2O3–2WO3 (RE = La, Nd and Sm) ceramics are packed tightly, and the grains exhibited clear boundaries and uniform size. The CLW, CNW, and CSW ceramics sintered at 1375 °C for 4 h possessed excellent microwave dielectric properties: Ɛr = 19.1, Q × f = 34370 GHz, τf = − 80 ppm/°C; Ɛr = 19.3, Q × f = 36610 GHz, τf = − 74 ppm/°C and Ɛr = 18.8, Q × f = 23240 GHz, and τf = − 68 ppm/°C, respectively. Moreover, the (1 − x)CNW–xTiO2 (0.3 ≤ x ≤ 0.6) and (1 − y)CNW–yCaTiO3 (0.4 ≤ y ≤ 0.7) ceramics were designed and prepared to get a thermally stable material. The addition of TiO2 and CaTiO3 had a significant impact on the performances of ceramics. With increasing the TiO2 and CaTiO3 content, the relative permittivity (Ɛr) and temperature coefficient of resonance frequency (τf) values of ceramics increased, but the quality factor (Q × f) values of ceramics decreased. Especially, 0.55CNW–0.45TiO2 and 0.45CNW–0.55CaTiO3 ceramics sintered at 1375 °C for 4 h had microwave dielectric properties of Ɛr = 22.4, Q × f = 32,490 GHz, and τf = − 0.5 ppm/°C and Ɛr = 23.4, Q × f = 6440 GHz, and τf = − 1.5 ppm/°C, respectively.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science. Materials in Electronics
- Journal Volume
- 31
- Journal Issue
- 17
- Journal Page Range
- p. 14953-14960
- ISSN
- 0957-4522
- CODEN
- JSMEEV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 56005099
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AUGMENTATION; CERAMICS; CRYSTAL STRUCTURE; DIELECTRIC MATERIALS; LANTHANUM ADDITIONS; LANTHANUM COMPOUNDS; LANTHANUM OXIDES; MICROSTRUCTURE; MICROWAVE RADIATION; PERMITTIVITY; RESONANCE; SAMARIUM OXIDES; SCANNING ELECTRON MICROSCOPY; SINTERING; TITANIUM OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; COHERENT SCATTERING; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FABRICATION; LANTHANUM ALLOYS; LANTHANUM COMPOUNDS; MATERIALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; RARE EARTH ADDITIONS; RARE EARTH ALLOYS; RARE EARTH COMPOUNDS; SAMARIUM COMPOUNDS; SCATTERING; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2020 © Springer Science+Business Media, LLC, part of Springer Nature 2020