Published 2009
| Version v1
Journal article
High-Resolution Magnetic Force Microscopy Using Carbon Nano tube Probes Fabricated Directly by Microwave Plasma-Enhanced Chemical Vapor Deposition
Creators
- 1. Nano High-Tech Research Center, Toyota Technological Institute, 2-12-1 Hisakata, Tempaku-ku, Nagoya 468-8511 (Japan)
Description
Carbon nano tubes (CNTs) have been successfully grown on the tip apex of an atomic force microscopy (AFM) cantilever by microwave plasma-enhanced chemical vapor deposition (MPECVD). Both scanning electron microscopy (SEM) and transmission electron microscopy (TEM) observations reveal that the diameter of the CNTs is 30 nm and the magnetic particles with diameter of 20 nm, which was used as catalyst for the CNT growth, exist on the top. This CNT probe has been applied to magnetic force microscopy (MFM) on the ultrahigh-density magnetic recording media with 1200 kilo flux change per inch (kfci).
Additional details
Publishing Information
- Journal Title
- Journal of Nanomaterials (Print)
- Journal Volume
- 2009
- Journal Issue
- 2009
- Journal Page Range
- p. 4
- ISSN
- 1687-4110
INIS
- Country of Publication
- Egypt
- Country of Input or Organization
- Egypt
- INIS RN
- 42004912
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CARBON; CATALYSTS; CHEMICAL VAPOR DEPOSITION; DENSITY; MAGNETIC FIELDS; MICROWAVE RADIATION; NANOTUBES; PARTICLES; PLASMA; PROBES; RESOLUTION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CHEMICAL COATING; DEPOSITION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; PHYSICAL PROPERTIES; RADIATIONS; SURFACE COATING