Multilayered ion-implanted BARITT diodes with improved efficiency
Creators
- 1. Texas Agricultural and Mechanical Univ., College Station (USA)
Description
Based on a model suggested by the authors (Eknoyan, Yang and Sze. Solid State Electron.; 20:285 (1977)), diodes having the multilayered n+ipνn+ structure have been fabricated from silicon material using ion implantation techniques. Systematic descriptions of their fabrication and evaluation are presented. Microwave CW oscillations at C-band (approximately 7.5 Ghz) have been observed in some of these devices. The measured maximum power output was in the range of 40 mw and the efficiency was approximately 5%. The obtained efficiency is the best reported for any BARITT diode. This result indicates that the retarding field region in BARITT diodes may be used advantageously to provide a favorable phase delay between the injected current and the a.c. voltage and leads to improved efficiency BARITT oscillators. (author)
Additional details
Identifiers
Publishing Information
- Journal Title
- Solid-State Electronics
- Journal Volume
- 20
- Journal Issue
- 4
- Series
- Solid-State Electron.
- Journal Page Range
- 291-295
- ISSN
- 0038-1101
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 8311503
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- BORON IONS; EFFICIENCY; FABRICATION; GHZ RANGE 01-100; ION IMPLANTATION; JUNCTION DIODES; LAYERS; MONOCRYSTALS; N-TYPE CONDUCTORS; OSCILLATIONS; P-N JUNCTIONS; P-TYPE CONDUCTORS; PERFORMANCE TESTING; PHYSICAL RADIATION EFFECTS; SILICON
- Descriptors DEC
- ATOMIC IONS; CHARGED PARTICLES; CRYSTALS; ELEMENTS; FREQUENCY RANGE; GHZ RANGE; IONS; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; SEMICONDUCTOR MATERIALS; SEMIMETALS; TESTING
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent