Studies on low-voltage x-ray radiography for graphite materials

Low-voltage radiography has been studied to provide optimum technique for graphite less than 50 mm thick. First we determined the exposure conditions under which the most appropriate photographic density can be obtained. By parametric studies, an exposure chart was prepared. Then we studied how the environment of photographing affected the film density. Thirdly, by use of graphite materials with artificial flaws, Image Quality Indicator (I.Q.I.) sensitivity was determined. Detectability of a crack depended on an incidence angle of X-rays onto a crack. Finally, we photographed graphites having natural flaws and gained a useful information. (author)