Published November 2012 | Version v1
Journal article Metadata-only

The development of direct radon measure instrument by markov method

Creators

  • 1. Chengdu University of Technology, Chengdu (China)
  • 2. Beijing Research Institute of Chemical Engineering and Metallurgy, Beijing (China)

Description

The article introduces the basic principle for markov' method in details. A hardware and software of the radon measure instrument by balloon has also been described. This system integrated au-si surface barrier detector and dc vacuum pump and designed a pneumatic switch valve. With the switch valve, the direction of gas path can be changed conveniently without the balloon being taken down. This instrument has an internal temperature and humidity sensor and ARM7 microprocessor as the logic core. It can store 2000 groups of data in the system. Meanwhile this Radon instrument has been tested in standard radon chamber of South China University and the results showed that the new developed balloon method measure radon apparatus could be applicable because of its easy use, great reliability and performance stability. (authors)

Additional details

Publishing Information

Journal Title
Nuclear Electronics and Detection Technology
Journal Volume
32
Journal Issue
11
Journal Page Range
p. 1324-1328
ISSN
0258-0934

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
49053965
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
BALLOONS; CHINA; COMPUTER CODES; DESIGN; EDUCATIONAL FACILITIES; HUMIDITY; MARKOV PROCESS; MICROPROCESSORS; PERFORMANCE; PNEUMATICS; RADON; RELIABILITY; SENSORS; STABILITY; STANDARDS; SURFACE BARRIER DETECTORS; SURFACES; SWITCHES; VACUUM PUMPS; VALVES
Descriptors DEC
AIRCRAFT; ASIA; CONTROL EQUIPMENT; ELECTRICAL EQUIPMENT; ELECTRONIC CIRCUITS; ELEMENTS; EQUIPMENT; FLOW REGULATORS; FLUID MECHANICS; FLUIDS; GASES; LABORATORY EQUIPMENT; MEASURING INSTRUMENTS; MECHANICS; MICROELECTRONIC CIRCUITS; MOISTURE; NONMETALS; PUMPS; RADIATION DETECTORS; RARE GASES; SEMICONDUCTOR DETECTORS; STOCHASTIC PROCESSES

Optional Information

Notes
6 figs., 3 tabs., 8 refs.