PIXE analysis of environmental and biological samples using a proton microprobe
- 1. Bochum Univ. (Germany, F.R.)
Description
For the investigation of environmental and biological samples a proton microprobe has been built at the Bochum Dynamitron Tandem Laboratory. By several improvements of the apparatus, e.g. optimization of the focal lengths and fine adjustment of the quadrupole lenses according to the results of a detailed beam transport calculation the beam diameter has been reduced to 6 μm fwhm. This device is used to measure lateral distributions of trace elements with Z > 15 in thin samples by means of PIXE. This technique has been applied to environmental and biological samples. An impactor sample has been investigated in order to test PIXE trace element measurements performed with a standard accelerator beam. In the field of biological samples our investigations concern the level of cooperative cellular colonies. Proceeding from a microphoto of a thin sample of human skin the element content in the region of interest has been determined by scanning. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods
- Journal Volume
- 181
- Journal Issue
- 1-3
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 165-170
- ISSN
- 0029-554X
Conference
- Title
- 2. International conference on particle induced X-ray emission and its analytical applications (PIXE-2).
- Dates
- 9 - 12 Jun 1980.
- Place
- Lund, Sweden.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 12626476
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELEMENTS; LI-DRIFTED SI DETECTORS; PROTON BEAMS; PROTON MICROPROBE ANALYSIS; TRACE AMOUNTS; X-RAY EMISSION ANALYSIS
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS