Published April 1, 1998
| Version v1
Report
High-resolution X-ray photoemission electron microscopy at the Advanced Light Source
Description
no abstract available
Availability note (English)
Available from www.als.lbl.govAdditional details
Publishing Information
- Imprint Pagination
- [vp.]
- Report number
- LBNL/ALS--25490
Conference
- Title
- Materials Research Society Meeting
- Dates
- 13-17 Apr 1998
- Place
- San Francisco, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 33061171
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- ADVANCED LIGHT SOURCE; ELECTRON MICROSCOPY; PHOTOEMISSION; PHOTON BEAMS; RESOLUTION; X RADIATION
- Descriptors DEC
- BEAMS; ELECTROMAGNETIC RADIATION; EMISSION; IONIZING RADIATIONS; MICROSCOPY; RADIATION SOURCES; RADIATIONS; SECONDARY EMISSION; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES
Optional Information
- Contract/Grant/Project number
- AC03-76SF00098
- Funding organization
- US Department of Energy (United States)