Published July 1992
| Version v1
Journal article
Boron gettering from p-Si volume at ion bombardment
- 1. AN Kazakhskoj SSR, Alma-Ata (Kazakhstan). Inst. Fiziki Vysokikh Ehnergij
Description
Experimental investigations into the migration of B in Si after irradiation with P+, O+, Fw+ ions with E=5 keV-1.2 MeV and Φ=1014-1016 cm-2 are conducted. It is shown that dunning irradiation B migrates to the surface from Si volume
Additional details
Additional titles
- Original title (Russian)
- Геттерирование атомов бора из обьема п-Си при ионном облучении
Publishing Information
- Journal Title
- Izvestiya Akademii Nauk - Rossijskaya Akademiya Nauk. Seriya Fizicheskaya
- Journal Volume
- 56
- Journal Issue
- 7
- Journal Page Range
- p. 27-31.
- ISSN
- 0367-6765
Conference
- Title
- 10. All-union conference on Ion interaction with surface.
- Original Conference Title
- Materialy 10. Vsesoyuznoj konferentsii ''Vzaimodejstvie ionov s poverkhnost'yu''
- Dates
- 25 Sep 1991.
- Place
- Moscow (Russian Federation).
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 25002209
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BORON; GETTERING; ION BEAMS; ION EMISSION; ION IMPLANTATION; IRON IONS; KEV RANGE; MASS SPECTRA; MASS TRANSFER; OXYGEN IONS; P-TYPE CONDUCTORS; PHOSPHORUS IONS; PHYSICAL RADIATION EFFECTS; SECONDARY EMISSION; SILICON
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELEMENTS; EMISSION; ENERGY RANGE; IONS; MATERIALS; RADIATION EFFECTS; SEMICONDUCTOR MATERIALS; SEMIMETALS; SPECTRA