A low power x-ray tube for use in energy dispersive x-ray fluorescence analysis
- 1. Bhabha Atomic Research Centre, Bombay (India). Nuclear Physics Div.
Description
A low power X-ray tube with thin molybdenum transmission target for use in energy dispersive X-ray fluorescence (ENDXRF) element analysis has been indigenously built, along with its power supply. The X-ray tube has been in operation since August 1979, and it has been operated upto maximum target voltage of 35 KV and tube current upto 200 μA which is more than sufficient for trace element analysis. This X-ray tube has been used alongwith the indigenously built Si(Li) detector X-ray spectrometer with an energy resolution of 200 eV at 5.9 Kev MnKsub(α) X-ray peak for ENDXRF analysis. A simple procedure of calibration has been developed for thin samples based on the cellulose diluted, thin multielement standard pellets. Analytical sensitivities of the order of a few p.p.m. have been obtained with the experimental setup for elements with 20 < = Z < = 38 and 60 < = Z < = 90. A number of X-ray spectra for samples of environmental, biological, agricultural, industrial and metallurgical interest are presented to demonstrate the salient features of the experimental sep up. (auth.)
Availability note (English)
MF available from INIS under the Report Number.Files
12587379.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 24 p.
- Report number
- BARC--1071
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 12587379
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CALIBRATION; CALIBRATION STANDARDS; ELEMENTS; FABRICATION; LI-DRIFTED SI DETECTORS; MULTI-ELEMENT ANALYSIS; POWER SUPPLIES; QUANTITATIVE CHEMICAL ANALYSIS; SENSITIVITY; TRACE AMOUNTS; USES; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROMETERS; X-RAY TUBES
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTRON TUBES; ELECTRONIC EQUIPMENT; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTROMETERS; X-RAY EMISSION ANALYSIS; X-RAY EQUIPMENT
Optional Information
- Notes
- 18 refs., 18 figures.